I'd appreciate any inputs and comments regarding bubble generation (and hopefully supression of bubbles) during CMP.
As you know metal polish slurries (especially copper and TSV) contain plenty of surfactants and hydrogen peroxide (other slurries do as well).
My experience has been that excessive bubble generation can be a real pain not only re: defects but also re: RR and overall pad surface quality management.
I am curious to know the community's thoughts on this.